Keysight Technologies An Evaluation of X-parameter*, P2D and S2D Models for Characterizing Nonlinear Behavior in Active Devices
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Keysight Technologies Simulation and Measurement-based X-parameter Models for Power Amplifiers with Envelope Tracking
Static X-parameter (XP) models for RF power amplifiers (PAs), derived from both simulations and nonlinear vector network analyzer (NVNA) measurements, are investigated for the prediction of PA performance under dynamic signal conditions such as in envelope tracking (ET). The instantaneous AM-AM, AM-PM and PAE predictions of XP models extracted from simulation are compared under ET dynamic signa...
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